摘要
在激光辐照行间转移CCD相机的实验中发现了关于CCD串扰效应的一个新现象,即在串扰线上出现缺口,该缺口紧邻主光斑上侧且随光强增大而减小。基于行间转移面阵CCD的构造和工作过程,利用CCD串扰效应的一种新机制对现象作出了合理的解释。串扰线的形成依赖于在垂直转移动作过程中CCD信号积分势阱中的载流子向垂直转移CCD寄存器中的溢出。串扰线上缺口的出现则是由于CCD的信号积分势阱被读出转移动作清空后再次填满需要经过一定时间,该时间内无信号电荷溢出至转移沟道;读出转移清空存储势阱的时刻是构成主光斑的主体信号电荷按正常时序进入垂直转移CCD寄存器的时刻,故缺口紧邻主光斑的上侧;光强越大,光电子再次填满存储势阱乃至溢出形成串扰线所需要的时间越短,则缺口越小。
A new phenomenon about crosstalk effect of CCD was discovered in the experiment of laser irradiating the inter- line transfer CCD camera. It is that a gap, adjoining the upper side of the main spot, appears on the crosstalk line and becomes smaller when laser becomes more intense. Through the analysis on the structure and process of interline transfer CCD image sen- sor, a new crosstalk mechanism is given to explain the phenomenon. In the process of vertieal transfer action, the overflowing of signal charges in integral well to vertical CCD register makes the crosstalk line. When readout transfer action empties the integral well, the integral well needs time to be refilled, during which no signal charge overflows to vertical CCD register. While the main signal charge package that makes the main spot in the output image of CCD is transferred from the integral well to the vertieal CCD register in normal scheduling, thus a gap appears adjoining the upper side of the main spot. When laser becomes more in- tense, less time will he needed for signal charges to fill the integral well and to overflow into vertical CCD register, and then the gap becomes smaller.
出处
《强激光与粒子束》
EI
CAS
CSCD
北大核心
2010年第7期1505-1510,共6页
High Power Laser and Particle Beams
基金
国家重点基础发展计划项目
关键词
激光
CCD
串扰线缺口
溢出中断
耦合转移
laser
CCD
gap on crosstalk line
pause of overflowing
coupled transfer
