摘要
通过对四钼酸铵(ATM)晶体的显微观察和组成的化学分析提出了晶界开裂理论(Crystalline interface cracking theory),其中包括硬开裂和软开裂。结果表明:在ATM的晶界和表面分别存在着晶界结晶水和表面水的内应力和外应力。必然导致ATM晶体的开裂,其中包括有序的软开裂和无序的硬开裂。软开裂与硬开裂比例的控制取决于干燥温度与结晶温度之间的差值及升温速率。差值越小,升温速率越低,软开裂ATM所占比例越大,干燥ATM及钼粉粒度分布越均匀,平均粒度越可控。因此,控制温度差值及升温速率对于ATM质量控制有着非常重要的作用。
On the base of crystalline structure micro observation and chemical component analysis for the ammonium tetramolybdate （ ATM ）, crystalline interface cracking theory, in which hard cracking and soft cracking were included has been proposed . The theory points out that the stress concentration to bring about craze cracking originates from the energy of crystalline interface inside and surface outside. The surface topography of ATM depends upon the difference between the crystalline temperature and the dry temperature, as well as the rate of raising temperature. The lower the average diameter, the narrower the particle distribution.
出处
《中国钼业》
2007年第5期29-35,共7页
China Molybdenum Industry
关键词
晶界开裂理论
润湿开裂
硬开裂
软开裂
四钼酸铵质量控制
ATM结晶工艺
crystalline interface cracking theory
wetting energy
hard cracking
soft cracking
quality control of ATM
crystalline technology of ATM
