期刊文献+

引信起爆控制电路冗余设计技术研究 被引量:2

Research on Redundancy Design of Fuze Fire Control Circuit
在线阅读 下载PDF
导出
摘要 引信起爆控制电路通过对目标探测信号的处理和决策,给出发火控制信号,其可靠性直接决定了其发火可靠度,工程上大多采用直接双套并联方式进行冗余设计。针对引信起爆控制电路如何进行冗余设计问题,设计了并联冗余和非冗余两种电路,采用数理统计的方法计算了其全寿命周期可靠度,结果表明非冗余电路可靠度略高于并联冗余电路。采用故障物理方法,分别通过加速寿命试验和故障物理仿真,得出了起爆控制电路在引信服役期内的温度应力、力学环境应力、电应力下的失效寿命远大于寿命期的结论。综合数理统计和故障物理研究结果,给出了引信起爆控制电路可采用非冗余设计的建议。 The target signal was processed by the fuze fire control unit,redundant circuit is often used to achieve high reliability.To get a more reliable fuze fire control circuit,parallel redundancy and non-redundant design schemes are studied.Life cycle reliabilities of two schemes are calculated by statistics approach,which mean that the reliability of non-redundant circuit is better than the redundant one.With the measures of physics of accelerated life test and failure simulation,time-to-failure of fuze fire control circuit is calculated under synthetical stresses of thermal,mechanics and and electronic.The calculation results show that the time-to-failure of the circuit is much more than the given index,and the scheme of non-redundant is feasible and effective.
作者 肖龙远 李豇 胡斌 黄琨 XIAO Longyuan;LI Jiang;HU Bin;HUANG Kun(Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang 621900, Sichuan, China)
出处 《火炮发射与控制学报》 北大核心 2022年第1期54-58,共5页 Journal of Gun Launch & Control
关键词 引信 起爆控制电路 冗余设计 故障物理 fuze fire control circuit redundancy design physics of failure
  • 相关文献

参考文献9

二级参考文献39

  • 1韩庆田,卢洪义,杨兴根.军用装备测试性技术发展趋势分析[J].仪器仪表学报,2006,27(z1):352-354. 被引量:24
  • 2张超,马存宝,宋东,许家栋.智能机内测试研究综述[J].计算机测量与控制,2007,15(2):141-144. 被引量:15
  • 3常庆,陈建辉,邱鹏,包林辉.基于机内测试的某型装备故障注入系统设计[J].仪表技术,2007(10):12-14. 被引量:3
  • 4Yusuf Leblebici,Sung-Mo(Steve)Kang.Hot-carrier reliability of MOS VLSI circuits[M].JOHN Kluwer Academic Publishers,1993.
  • 5W Weber.Dynamic stress experiments for understanding hot-carricer degradation phenomena[J].IEEE Trans.Electron Devices,1988,ED-35:1476-1486.
  • 6Xiao JunLi,Jin Qin,Bing Huang,XiaoHu Zhang,Joseph B.Bernstein.A New SPICE Reliability Simulation Method for Deep Submicronmeter CMOS VLSI Circuits[J].IEEE Transactions On Device And Materials Reliability,2006,6(2).
  • 7Cadence.Reliability Simulation in intergrated circuit design[P].White Paper.
  • 8Cadence.Virtuoso RelXpert Reliability Simulator User Guide[P].Product Version 7.1.1,2010.
  • 9GGE. Draft protocol on cluster munitions [ R]. Genevese: CCW, 2010.
  • 10RYAN Gorman. Cluster munitions replacement gun & mis- sile symposium [ R]. ARDEC Project Officer (APO).

共引文献33

同被引文献19

引证文献2

二级引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部