摘要
SRAM型FPGA在航天领域有着广泛的应用,配置刷新能提高SRAM型FPGA抗单粒子翻转的能力,目前宇航SRAM型FPGA的抗SEU动态刷新电路设计技术已经较为成熟,但是如何验证其功能正确性,没有给出特殊方法。本文提出四种消除单粒子效应造成的软故障的抗SEU的FPGA设计方式,并重点针对周期性闭环配置刷新方式进行了仿真验证技术研究,找出验证该模式的关键验证要点,供验证人员作为指导。
SRAM-based FPGA has been widely applied to astronautics.The adverse effects caused by SEU can be effectively controlled by scrubbing.At present hardware circuit design of technology of the SRAM-based FPGA to SEU is relatively mature,but how to verify the functional correctness,no special method is given.This paper puts forward four kinds of eliminating single particle effect caused by the soft fault of SEU.This paper focuses on the research of simulation verification technology of periodic closed-loop configuration scrubbing,find out the key points of verification,as a guidance for verification personnel.
作者
祝周荣
姜丽梅
刘国斌
刘芳汝
ZHU Zhou-rong;JIANG Li-mei;LIU Guo-bin;LIU Fang-ru(Shanghai Aerospace Software Evaluation Center,Shanghai 201109)
出处
《数字技术与应用》
2018年第2期40-42,共3页
Digital Technology & Application
关键词
FPGA
SEU
动态刷新
SRAM
Field Programmable Gata Array
Single event upset
Scrubbing dynamically
Static random-access memory
