摘要
非均匀性是影响红外成像电阻阵列系统输出场景图像质量的关键因素,直接影响红外场景模拟逼真度和半实物仿真置信度。基于实测数据分析了电阻阵列系统非均匀性的特点,分析研究了稀疏网格及flood校正方法,结合现有测量条件研究并验证了一种工程实用的稀疏网格非均匀性校正流程及非均匀性校正算法,实现了非均匀性数据采集、查找表生成、及非均匀性校正,基于校正软件实现了电阻阵列非均匀校正算法的仿真验证,结果证明经非均匀校正后图像质量显著提高,该非均匀性校正流程及算法为实现高置信度红外成像制导半实物仿真试验奠定基础。
The non-uniformity characteristic is the crucial factors affecting the image quality projected by infrared imaging resistor array, and which affects the fidelity of the infrared scene simulation. The non-uniformity characters of the infrared imaging simulation resistor array were analyzed based on measured data; the sparse grid and the flood non-uniformity correction technologies were investigated and analyzed and based on the existing measuring technology the improved sparse grid method for engineering was proposed. Through measuring the non-uniformity data, establishing the linear look-up table and correcting the non-uniformity image, the non-uniformity correction algorithm was developed and validated. The result shows that the image quality has a remarkable improvement after non-uniformity correction, the non-uniformity correction flow and algorithm preferably satisfy the requirement of the high confidence infrared imaging simulation.
出处
《系统仿真学报》
CAS
CSCD
北大核心
2016年第1期70-76,共7页
Journal of System Simulation
基金
重点实验室基金资助(9140C600103110C60)
关键词
红外成像
非均匀性
电阻阵列
稀疏网格
校正
infrared imaging
non-uniformity
resistor array
sparse grid
correction
