摘要
使用迈克耳孙干涉仪测量了厚透明材料的折射率.在光路中一半视场平行放入待测材料,对应的条纹出现压缩,根据条纹隐入和涨出计算待测材料的折射率,并进行了相关实验和误差分析.应用Zemax软件对实验进行了模拟,验证了其可行性.
A method to measure the refractive index of thick transparent material using the Michelson interferometer was presented. The stripe changed with the insertion of the transparent material into part of the optical path. The refractive index of the material was obtained by recording and analyzing the variations of the stripes, the error analysis of the result was presented. In addition, Zemax simulation was also carried out, which confirmed the feasibility.
出处
《物理实验》
2012年第6期35-39,共5页
Physics Experimentation
