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(001)高度择优取向Ba_(0.6)Sr_(0.4)TiO_3/Pt异质结的结构及性能 被引量:1

Structure and Physical Properties of(001) Highly Oriented Ba_(0.6)Sr_(0.4)TiO_3/Pt Heterostructure
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摘要 采用射频磁控溅射法结合高真空后退火处理,在MgO(001)单晶基片上制备了Pt薄膜。应用脉冲激光沉积法在Pt/MgO上进一步生长了Ba0.6Sr0.4TiO3(BST)薄膜。借助X射线衍射仪(XRD)、铁电测试仪、LCR表研究了BST/Pt/MgO的结构和性能。研究发现,700℃真空退火可以保证Pt薄膜在MgO基片上实现(001)高度择优生长,以(001)Pt薄膜为模板,可以进一步获得(001)高度择优取向具有铁电性能BST薄膜。在100 Hz测试频率下,BST薄膜最大介电常数为1100、调谐率为81%、品质因数为21;在7 V的电压下,漏电流密度1.85×10-5A/cm2,进一步分析表明,BST薄膜在0-2.6 V之间满足欧姆导电机制,在2.6-7 V之间满足普尔-弗兰克导电机制。 Pt film was prepared on MgO(001) single crystal substrate using radio-frequency magnetron sputtering,combined with high vacuum post annealing process.BST film was further fabricated on Pt/MgO by pulsed laser deposition method.The structure and physical properties of BST/Pt/MgO heterostrucutre were characterized by XRD,ferroelectric tester,and LCR meter.The results showed that Pt film is highly(001) oriented after 700 ℃ vacuum annealing,and(001) highly oriented BST film with ferroelectric property can be obtained using(001) Pt as template.The test frequency is 100 Hz,the maximum dielectric constant,tunability and dielectric loss of a BST capacitor are 1100,81%,0.074,respectively.The leakage current density of the BST capcitor is 1.85×10-5 A/cm2 at 7 V.Schottky conduction mechanism is found to dominate the current conduction at low voltages ranging from 0 to 2.6 V,and at the voltages,ranging from 2.6-7 V,BST capacitor meets Poole-Frenkel emission conduction.
出处 《人工晶体学报》 EI CAS CSCD 北大核心 2010年第6期1475-1478,1498,共5页 Journal of Synthetic Crystals
基金 国家自然科学基金(No.60876055 11074063)资助项目 河北省自然科学基金(E2008000620)资助项目 河北省应用基础研究计划重点基础研究项目(10963525D) 高等学校博士点基金(No.20091301110002) 河北省教育厅科学研究计划(No.2007416) 河北省科学技术厅科学技术研究与发展指导计划(No.07215154) 河北大学博士基金(y2006091)资助项目
关键词 BST薄膜 脉冲激光沉积 导电机制 BST thin films PLD conduction mechanism
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参考文献14

  • 1Shen H,Gao Y H,Zhou P,et al.Effect of Oxygen to Argon Ratio on Properties of (Ba,Sr)TiO3 Thin Films Prepared on LaNiO3/Si Substrates[J].J.Appl.Phys.,2009,105(6):1-4.
  • 2Nagaraj B,Sawhney T,Peruesse S,et al.(Ba,Sr)TiO3 Thin Films With Conducting Perovskite Electrodes for Dynamic Random Access Memory Applications[J].Appl.Phys.Lett.,1999,74(21):3194-3196.
  • 3Kim H S,Hyun T S,Kim H G,et al.Orientation Effect on Microwave Dielectric Properties of Si-integrated Ba0.6Sr0.4TiO3 Thin Films for Frequency Agile Devices[J].Appl.Phys.Lett.,2006,89(5):1-3.
  • 4Maio J,Chen W R,Zhao L,et al.Enhanced Dielectric Properties of Ba1-xSrxTiO3 Thin Film Grown on La1-xSrxMnO3 Bottom Layer[J].J.Appl.Phys.,2004,96(11):6578-6584.
  • 5Wang Y,Liu B T,Wei F,et al.Fabrication And Electrical Properties of (111) Textured (Ba0.6Sr0.4)TiO3 Film on Platinized Si Substrate[J].Appl.Phys.Lett.,2007,90:042905:1-3.
  • 6孙杰,刘保亭,陈江恩,娄建忠,周阳.非晶Ni-Al阻挡层对快速退火制备的硅基Ba_(0.6)Sr_(0.4)TiO_3薄膜结构及物性影响的研究[J].人工晶体学报,2010,39(2):318-323. 被引量:4
  • 7李桂英,余萍,肖定全.Ba_(1-x)Sr_xTiO_3薄膜的Sol-gel制备技术与微结构[J].人工晶体学报,2006,35(5):931-935. 被引量:3
  • 8Moon S E,Kim E K,Kwak M H,et al.Orientation Dependent Microwave Dielectric Properties of Ferroelectric Ba1-xSrxTiO3 Thin Films[J].Appl.Phys.Lett.,2003,83(11):2166-2168.
  • 9Yamada T,Muralt P,Sherman V O,et al.Epitaxial Growth of Ba0.3Sr0.7TiO3 Thin Films on Al2O3(0001) Using Ultrathin TiN Layer as a Sacrificial Template[J].Appl.Phys.Lett.,2007,90:142911(1-3).
  • 10Qin W F,Xiong J,Zhu J,et al.Fabrication and Characterization of Epitaxial Ba0.6Sr0.4TiO3/LaNiO3 Heterostructures[J].Mater.Electron.,2007,18(9):973-976.

二级参考文献26

  • 1李桂英,余萍,于光龙,王欢,肖定全.溶胶-凝胶法制备(Ba,Sr)TiO_3薄膜的新技术路线研究[J].功能材料,2005,36(3):343-345. 被引量:3
  • 2Cole M W,Ngo E,Hirsch S,et al.The Fabrication and Material Properties of Compositionally Multilayered Ba1-xSrxTiO3 Thin Films for Realization of Temperature Insensitive Tunable Phase Shifter Devices[J].J.Appl.Phys.,2007,102(3):034104.
  • 3Kozyrev A B,Kanareykin A D,Nenasheva E A,et al.Observation of an Anomalous Correlation between Permittivity and Tunability of a Doped (Ba,Sr)TiO3 Ferroelectric Ceramic Developed for Microwave Applications[J].Appl.Phys.Lett.,2009,95(1):012908.
  • 4Zhu X H,Guigues B,Defa E,et al.Thermal Strain-induced Dielectric Anisotropy in Ba0.7Sr0.3TiO3 Thin Films Grown on Silicon-based Substrates[J].J.Appl.Phys.,2009,106(2):024109.
  • 5Wu C G,Li Y R,Zhu J,et al.Great Enhancement of Pyroelectric Properties for Ba0.65Sr0.35TiO3 Films on Pt-Si Substrates by Inserting a Self-buffered Layer[J].J.Appl.Phys.,2009,105(4):044107.
  • 6Wang Y,Liu B T,Wei F,et al.Fabrication and Electrical Properties of (111) Textured (Ba0.6Sr0.4)TiO3 Film on Platinized Si Substrate[J].Appl.Phys.Lett.,2007,90(4):042905.
  • 7Wang Y,Liu B T,Wei F,et al.Effect of (Ba+Sr/Ti) Ratio on the Dielectric Properties for Highly (111) Oriented (Ba,Sr)TiO3 Thin Films[J].J.Alloys.Compd,2009,475:827-831.
  • 8Pertsev N A,Dittmann R,Plonka R,et al.Thickness Dependence of Intrinsic Dielectric Response and Apparent Interfacial Capacitance in Ferroelectric Thin Films[J].J.Appl.Phys.,2007,101(7):074102.
  • 9Podpirka A,Cole M W,Ramanathan S.Effect of Photon Irradiation on Structural,Dielectric,and Insulating Properties of Ba0.60Sr0.40TiO3 Thin Films[J].Appl.Phys.Lett.,2008,92(21):212906.
  • 10Zhu W C,Cheng J R,Yu S W,et al.Enhanced Tunable Properties of Ba0.6Sr0.4TiO3 Thin Films Grown on Pt/Ti/SiO2/Si Substrates Using MgO Buffer Layers[J].Appl.Phys.Lett.,2007,90(3):032907.

共引文献4

同被引文献22

  • 1Meng Q D, Zhang X Q, Li F,et al. An Impedance Matched Phase Shifter Using BaSrTi03 Thin Film[ J]. IEEE Microwave and WireUssCompenents IeWers,2006,16(6) *345-347.
  • 2Wang D Y,Wang J, Chan H L W, et al. Structural and Electro-optic Properties of Bao 7Sr0 3Ti03 TTiin Filins Grown on Various Substrata UsingPulsed Laser Deposition [ J]. Journal of Allied Physics,2007,101 :043515-043517.
  • 3Dawle J T, Clem P G. Dielectric Properties of Randmn and (100) Oriented SrTi03 and (Ba, Sr)Ti03 Thin Films Fabricated on( 100) NickelTapes[ J]. Applied Physics LeUm,2002,81 (16) :30游-3030.
  • 4Yamada T,Muralt P, Sherman V 0,et al. Epitaxial Growth of Bao 3 Sr0 7Ti03 Thin Films on A1203 (0001 ) Using Ultrathin TiN Layer asSacrificial Template [ J] . Applied Physics Letters,2007,90:142911.
  • 5Horwitz J S,Chang W,Kim W, et al. The Effect of Stress on the Microwave Dielectric Properties of Bao 5Sr0 5Ti03 Thin Films[ J]. Journal ofElectroceramics,2000,4 : 357-363.
  • 6Fang T H, Chang W J, Lin CM,et al. Effect of Annealing on the Structural and Mechanical Properties of Bao 7Sr0 3Ti03 Thin Films [ J].Materials Science and Engineering A ,2006,426 : 157-161.
  • 7Malic B, Boerasu I,Mandeljc M, et al. Processing and Dielectric Characterization of Bsq」Sr0.7TiO3 Thin Films on Alumina Substrates[ J].Journal of the European Ceramic Society ,2001,27 ;2945-2948.
  • 8Shaw T M, SuoaZ, Huang M, et al. The Effect of Stress on the Dielectric Properties of Barium Strontium Titanate thin Films[ J]. Applied Physicsletters,1999,75(14) :2129-2131.
  • 9Gim Y, Hudson T, Fan Y, et al. Microstructure and Dielectric Properties of Baj-S-T- Films Grown on LaA103 Substrates [ J]. Applied PhysicsLetters,2000: 1200-1202.
  • 10唐伟忠.薄膜材料制备原理、技术及应用[M].第二版.北京:冶金工业出版社,2005:140-194.

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