摘要
介绍了在LabVIEW环境下开发测试程序VI(虚拟仪器)测试片状元件试样的方阻、电阻率以及电阻温度系数TCR随温度的变化关系,主要包括电阻温度特性测控系统的硬件构成,基于LabVIEW开发平台的测控软件框图及测试程序。该测试系统在-20℃~120℃温度范围内能够实现对元件试样的多点测试,升温方法采取线性升温,且升温速率可在0.1℃/min^10℃/min之间选择,测试结果对于介电材料性能的研究以及元器件开发都有一定的价值。
This text introduced development of testing program VI （virtual instrument） on testing the changeable relationships among square resistance, electric resistance rate and electric resistance temperature coefficient TCR by LabVIEW.It put emphasis on system and software of detecting electric resistance temperature characteristic.This system can realize several-point testing within temperature range from - 20℃ to ＋ 120℃ .Meanwhile,as this system use liner heating methed,the heating rate can be controlled from 0.1℃/min to 10℃/min.Testing result shows great value on research of characteristic of dielectric material as well as development of electric parts.
出处
《中国测试技术》
2006年第5期66-68,共3页
CHINA MEASUREMENT & TESTING TECHNOLOGY
关键词
介电材料
方阻
电阻温度系数
测控系统
Dielectric materials
Square resistance
Resistance temperature ccefficient
Control system
