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混合微电路用导电胶粘接特性的研究 被引量:7

Research on Bonding Properties of Electrically Conductive Adhesives for Hybrid Microcircuits Application
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摘要 导电胶的粘接可靠性是制约其应用的主要影响因素.针对混合微电路用导电胶粘接的主要失效模式。设计了相应的测试结构和可靠性评价试验,研究了导电胶粘接的机械性能和电性能的退化机制。结果表明试验用导电胶粘接具有较好的耐温变应力性能,其剪切力在3.25~5.35kg之间,结合微观形貌特征分析和理论分析,对导电胶粘接失效机理进行了深入的探讨,并提出了提高导电胶粘接特性的合理方法,最后对目前工艺枢平下的导电胶粘接可靠性进行了相应评价。 Nowadays, Donding reliability of electrically conductive adhesives (ECAs) has become one of the difficulties in its application. Aiming at the ECAs bonding' major failure modcs, the accordant test structure and reliability evaluation experiment was developed. Then the mechanical properties and degradation mechanism of electrical properties for ECAs bonding were studied. The result showed that ECAs bonding had a good resistance to temperature dependent stress with a shear force ranging from 3.25 to 5.35 kg. Based on a combination of morphology and theory analysis, the failure mechanism of ECAs bonding was deeply discussed, and then ,some reasonable methods to improve performance of ECAs bonding were presented. Finally ECAs bonding reliability at present technical level was evaluated.
出处 《武汉理工大学学报》 EI CAS CSCD 北大核心 2006年第3期18-21,共4页 Journal of Wuhan University of Technology
基金 国家自然科学基金(60371046)
关键词 导电胶粘接 结构与特性 失效机理 ECAs bonding structure and property failure mechanism
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参考文献14

  • 1鲜飞.导电胶粘剂的研究现状[J].粘接,2001,22(5):37-38. 被引量:13
  • 2陈党辉,顾瑛,陈曦.国外微电子组装用导电胶的研究进展[J].电子元件与材料,2002,21(2):34-39. 被引量:21
  • 3张军,陈旭.各向异性导电胶粘接可靠性研究进展[J].电子元件与材料,2004,23(1):35-38. 被引量:23
  • 4高艳茹,李小兰.电子元器件表面组装用导电胶粘剂[J].绝缘材料通讯,2000(1):23-25. 被引量:5
  • 5James J L,Leonard R E.混合微电路技术手册[M].北京:电子工业出版社,2004.
  • 6Nysaether J B,Lai Z,Liu J.Thermal Cycling Lifetime of Flip Chip on Board Circuits with Solder Bumps and Isotropically Conductive Adhesive Joints[J].IEEE Trans Advanced Packaging,2000,23(4):743~749.
  • 7Périchaud M G,Delétage J Y,Frémont H,et al.Reliability Evaluation of Adhesive Bonded SMT Components in Industrial Applications[J].Microelectronics and Reliability,2000,40(7):1227~1234.
  • 8Liu J,Gustafsson K,Lai Z H,et al.Surface Characteristics,Reliability and Failure Mechanisms of Tin/Lead,Copper and Gold Metallization[J].IEEE Transactions on Components Packaging and Manufacturing Technology-Part A,1997,20(1):21~30.
  • 9JESD22-A104-A,Temperature Cycling(EIA)[S].
  • 10MIL-STD-883E,Test Method Standard for Microcircuits(DOD)[S].

二级参考文献21

  • 11,“Conductive Adhesive for surface Mount Devices”Y.Jwasa,Electronic Packaging & Produetion,1997,15(37)
  • 22,“Paint flow and Pigment Dispersion by T.C Patton”Japanese Version
  • 3[5]Gautam Sarkar, Mridha S, Tan Tin Chong. Flip chip interconnect using anisotropic conductive adhesive [J]. J Mater Process Technol, 1999, 89-90: 484-490.
  • 4[6]Chan Y C, Luk D Y. Effects of bonding parameters on the reliability performance of anisotropic conductive adhesive interconnects flip-chip-on-flex packages assembly ii.different bonding pressure [J]. Microelectron Reliab, 2002, 42: 1195-1204.
  • 5[7]Kyuny-Wook Paik, Myung-Jin Yim. New anisotropic conductive adhesive for low cost and reliable flip chip on organic substrates applications [A]. International Symposium on Electronic Materials and Packaging [C]. 2000. 282-288.
  • 6[8]Dominique Wojciechowski, Jan Vanfletern, Elisabeth Reese. Electro- conductive adhesive for high density package and flip-chip interconnections [J]. Microelectron Reliab, 2000, 40: 1215-1226.
  • 7[9]Akira Nagai, Kenzo Takemura, Kazuhiro. Anisotropic conductive adhesive films for flip-chip interconnection onto organic substrates [R]. 1998 IEMT/IMCP Proceedings, 353-357.
  • 8[10]Briegel R, Ashauer M, Sandmaier H. Anisotropic conductive adhesive of microsensors applied in the instance of a low pressure sensor [J]. Sens Actuat, 2002, A97-98: 323-328.
  • 9[11]Chan Y C, Hung K C, Tang C W. Degradation mechanisms of the anisotropic conductive for flip chip on flex applications [A]. Proceedings of 4th International Conference on Adhesive Joining and Coating Technology in Electronics Manufacturing [C]. 2000. 141-146.
  • 10[12]Chiu Y W, Chan Y C, Lui S M. Study of short-circuiting between adjacent joints under electric field effects in fine pitch anisotropic conductive adhesive interconnects [J]. Microelectron Reliab, 2002, 42: 1945-1951.

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