摘要
本文采用电感耦合等离子发射光谱法(iCp-aeS)同时测定高纯铜中的多种杂质元素(p, mn, fe, ni, Zn, aS, Se, ag, Cd, Sn, Sb).优化仪器的工作条件,以基体匹配法配制工作曲线标样,有效地消除基体干扰.检出限为0.000004%～0.0001%,回收率在85.9%～105%范围内.方法简便、可满足工业分析要求.
A method was described for simultaneous determination of multielements(such as P,Mn,Fe,Ni,Zn,As,Se,Ag,Cd,Sn,Sb) in pure copper by Inductively Coupled Plasma Atomic Emission Spectrometry(ICP-AES) in this paper.The operational parameters were optimized,and the interference from matrix was effectively eliminated with matrix matching.The detection limit of analyte elements in the pure copper sample ranged from 0.000004% to 0.0001%,the recovery was within the range of 89.5 % to 105 %.Such method is simple and meets the requirement of industrial analysis.
出处
《现代仪器》
2006年第5期23-23,20,共2页
Modern Instruments
