摘要
分析了存储器产生错误的原因 ,提出了提高其可靠性的有效途径。结合航天计算机可靠性增长计划 ,给出了一套利用纠检错芯片对其进行容错的方案 ,并给出了通过 CPL D器件实现的仿真结果。最后对容错存储器的可靠性进行了分析。
False reasons of memory was analyzed and an effective approach to enhance its reliability was put forward A scheme to carry out fault tolerant using chip was given CPLD implement of the circuits and corresponding simulation results were presented Finally,analyzing the reliability of fault tolerant memory
出处
《现代电子技术》
2004年第4期4-6,共3页
Modern Electronics Technique
基金
国防预先研究和基金项目 ( 4 1 32 30 60 1 0 7)
