摘要
在吹膜机生产加工过程中,吹膜机张力的精准控制和稳定性是影响薄膜质量的关键因素,传统PLC控制的吹膜机张力控制系统是一个非线性、强耦合和抗干扰能力低的控制系统,结合吹膜机设备结构功能特点,搭建薄膜收卷张力控制系统模型,采用变论域模糊PID控制方式实现对吹膜机张力精准的提高。变论域模糊PID控制主要是通过伸缩因子来实时调整模糊论域变化进而实现动态调节PID参数,通过MATLAB仿真对比分析可知,变论域模糊PID在收卷张力控制效果方面优于模糊PID和传统PID控制方式,且吹膜机张力控制系统无超调,上升时间短,抗干扰能力强。实验表明,变论域模糊PID控制策略对非线性时变的薄膜张力控制效果改变显著。
In the production and processing process of the film blowing machine,the precise control and stability of the tension of the film blowing machine were key factors affecting the quality of the film.The traditional PLC controlled tension control system of the film blowing machine was a nonlinear,strong coupling,and low anti-interference control system.This design combines the structural and functional characteristics of the film blowing machine equipment to build a film winding tension control system model,Adopted variable universe fuzzy PID control method to achieve precise improvement of the tension of the film blowing machine.The variable universe fuzzy PID control mainly adjusts the changes of the fuzzy universe in real-time through the scaling factor to achieve dynamic adjustment of PID parameters.Through MATLAB simulation and comparative analysis,it was found that the variable universe fuzzy PID was superior to the fuzzy PID and traditional PID control methods in the control effect of winding tension,and the tension control system of the film blowing machine has no overshoot,short rise time,and strong anti-interference ability.The experiment shows that the variable universe fuzzy PID control strategy has a significant change in the effectiveness of nonlinear and time-varying film tension control.
作者
孟锦涛
国海
樊晓宇
路超
周小杰
刘晓伟
MENG Jintao;GUO Hai;FAN Xiaoyu;LU Chao;ZHOU Xiaojie;LIU Xiaowei(School of Electrical and Electronic Engineering,Anhui University of Science and Technology,Bengbu,Anhui 233100,China)
出处
《塑料》
CAS
CSCD
北大核心
2024年第3期21-27,共7页
Plastics
基金
安徽省教育厅自然科学基金重点项目(2022AH040234)
安徽省教育厅自然科学基金重点项目(2022AH051633)。
关键词
变论域
稳定控制
塑料吹膜机
模糊PID
超调量
variable universe
stability control
plastic film blowing machine
fuzzy PID
overshoot
