摘要
原子力显微镜(atomic force microscopy,AFM)是一种具有超高分辨率的新型探针显微镜,已广泛应用于生物医学领域。该研究利用AFM检测X射线对细胞形貌和杨氏模量的影响,结果显示照射后的细胞表面变得粗糙,细胞高度降低,杨氏模量减小,提示细胞的刚性降低。进一步通过免疫荧光和流式细胞术实验发现,X射线能够破坏细胞骨架,损伤线粒体,进而诱发细胞凋亡。使用AFM研究辐射诱导的细胞损伤可以帮助人们了解辐射引起的组织病理改变,为一些放射病的诊断和治疗提供更多的理论依据。
Atomic force microscopy(AFM) is a new type of probe microscope with ultra-high resolution,which has been widely used in the field of biomedicine.AFM is used to detect the effect of X-ray on cell morphology and Young’s modulus in this study.The results show that the cell surface become rough,the cell height and Young’s modulus decreased after cells exposed to X-ray,suggesting that the rigidity of the cells reduced.Further immunofluorescence and flow cytometry experiments reveal that X-ray can destroy the cytoskeleton,injure mitochondria and induce cell apoptosis.Using AFM to study radiation-induced cell damage can help people understand the histopathological changes caused by radiation,and provide more theoretical basis for the diagnosis and treatment of some radiation diseases.
作者
吴安庆
胡文涛
WU Anqing;HU Wentao(School of Radiation Medicine and Protection,Suzhou Medical College of Soochow University,Suzhou 215123,China;State Key Laboratory of Radiation Medicine and Protection,Suzhou 215123,China)
出处
《实验技术与管理》
CAS
北大核心
2022年第3期37-41,共5页
Experimental Technology and Management
基金
国家自然科学基金项目(32071243)。
关键词
原子力显微镜
X射线
细胞辐射损伤
atomic force microscopy
X-ray
radiation-induced cell damage
