摘要
计算机断层扫描是一种可重构患者身体横截面的非侵入式X射线诊断技术。它可以有效地提供有关器官结构的详细信息,并灵敏地检测出器官的病理变化。自20世纪70年代第一代计算机断层扫描被用于临床诊断以来,在该领域上的多项突破促成了现今超快速、低剂量的扫描技术,这种高检测效率和快速响应一定程度上归功于X射线检测器的发展。根据不同的工作原理,当前X射线探测器主要可分为间接和直接探测两种。此外,在过去二十年中,通过利用不同排列形状和工作机制的X射线探测器,高分辨率临床显微断层扫描系统也得到了显著的发展。本文旨在回顾用于断层扫描和显微断层扫描的X射线探测器技术发展的几个重要里程碑,并且具体分析两种类型探测器的基本工作原理和未来发展趋势。
Computed tomography(CT)is a non-invasive X-ray diagnostic technique that allows reconstructing cross sections of a patient's body.It provides detailed information about structure of organs and examining pathological changes sensitively.Since the first CT scan for clinical use in the 70 s,several improvements have led to the current configuration of modern ultra-fast,low dose CT scans.X-ray detector technology enables growing detection efficiency and fast response.Such developments are partly brought about by advances in X-ray detectors,which can by mainly sorted into two types:indirect conversion and direct conversion based on different working principle.Systems for high-resolution preclinical CT(or micro-CT)have also seen a considerable growth in the last two decades,taking advantage of the modern technology of X-ray detectors of different geometry and mechanism.This article aims at reviewing the milestones of the evolution of X-ray detector technology that have traced the development of CT and micro-CT.An outlook of the current and future trends on both two types of detection methods will be also given.
作者
李可欣
王琦龙
LI Ke-xin;WANG Qi-long(School of Electronic Science&Engineering,Southeast University,Nanjing 210096,China)
出处
《真空电子技术》
2021年第5期13-28,88,共17页
Vacuum Electronics
