摘要
激光剥蚀电感耦合等离子体质谱(LA-ICP-MS)是目前锆石研究常用方法之一,该法普遍采用环氧树脂靶为载体,对锆石环氧树脂靶表面形貌及平整度影响进行研究,有助于评估其制作工艺以及LA-ICP-MS锆石分析的准确性。本次研究采用原子力显微镜(AFM)对锆石环氧树脂靶表面进行形貌分析,并通过分析和对比193nm激光不同剥蚀模式和不同剥蚀条件下的锆石表面形貌,研究锆石表面形貌及平整度对LA-ICP-MS锆石分析的影响;同时实验采用氩离子抛光技术对锆石环氧树脂靶进行二次抛光,并探讨该技术对锆石环氧树脂靶影响。实验结果表明本次靶中表面总体平整性较好但存在细微的不平,锆石表面存在程度较小(几至几十纳米的不等)的擦痕,锆石颗粒边缘与靶面存在高差和间隙;而通过研究后认为锆石表面细微的不平对于分析的影响小于能量密度、频率、移动速率等其他激光参数的影响,对分析准确性的影响较小。实验分析并对比了锆石和玻璃标准等不同基体的线扫描形貌,发现其剥蚀深度以及剥蚀形貌存在差异,相同剥蚀条件下线扫描剥蚀深度:NIST610>CGSG系列>锆石91500。经氩离子二次抛光后锆石样品表面擦痕不明显,但可能会对锆石造成损伤等影响。本次研究认为锆石环氧树脂靶表面总体平整性较好,锆石表面细微的不平对分析准确性的影响较小,不同基体的线扫描形貌研究则为LA-ICP-MS锆石及其他分析提供了参考,而氩离子抛光技术对LA-ICP-MS分析的影响及应用还有待进一步的研究。
BACKGROUND:Laser ablation-inductively coupled plasma-mass spectrometry(LA-ICP-MS)is currently one of the commonly used methods for zircon research.This method generally uses epoxy resin targets as carriers.Studying the effect of the surface morphology and flatness of epoxy resin targets helps to evaluate its production process and the accuracy of LA-ICP-MS zircon analysis.OBJECTIVES:To study the influence of the surface morphology of epoxy resin for zircon analysis by LA-ICP-MS.METHODS:Atomic force microscope(AFM)was used to analyze the surface morphology of zircon epoxy resin target,and the zircon surface morphology was studied by analyzing and comparing the zircon surface morphology under different ablation modes and different ablation conditions of 193nm laser.The influence of flatness on LA-ICP-MS zircon analysis was discussed.Argon ion polishing technology was used to perform secondary polishing on the zircon epoxy resin target,and the influence of this technology on the zircon epoxy resin target was investigated.RESULTS:The surface of the zircon epoxy resins was generally smooth but slightly uneven.There were scratches from a few to tens nm on the surface of the zircon.The differences in height and gaps existed between zircons and epoxy resin.The slightly uneven surface had less impact on the analysis accuracy than other laser parameters such as energy density,frequency and movement rate.The depth and morphology of different matrices by linear scanning were dissimilar.The scanning depths on the NIST610,CGSG series,zircon 91500 decreased under the same laser condition.The scratches of zircon surface were not obvious after Ar-ion milling,but the zircons may have been damaged.CONCLUSIONS:The surface morphology of zircon epoxy resins has less impact on the analysis accuracy for LA-ICP-MS.The influence and application of Ar-ion milling for LA-ICP-MS needs further study.
作者
胡志中
王坤阳
晏雄
杨波
杜谷
HU Zhi-zhong;WANG Kun-yang;YAN Xiong;YANG Bo;DU Gu(Chengdu Center of Geological Survey,China Geological Survey,Chengdu 610081,China)
出处
《岩矿测试》
CAS
CSCD
北大核心
2020年第6期804-815,共12页
Rock and Mineral Analysis
