摘要
红外焦平面成像质量受材料生长及器件制备工艺的影响,易出现盲元、条纹噪声等缺陷。条纹噪声经常会导致盲元的检测偏差,准确的盲元检测对于后续图像处理具有重要意义。利用双密度双树复数小波分解的多方向性小波系数,结合广义高斯分布将高频小波系数按照对条纹噪声影响程度分别赋予不同权值并进行单支重构,消除了条纹噪声对盲元检测的影响,得到初步"干净"的预处理图像,进而对预处理图像运用3σ准则进行盲元检测。通过短波Hg Cd Te红外焦平面成像的实践验证,该方法对具有条纹噪声特征的红外图像盲元检测更加准确。
Subjected to the material quality and the device fabrication techniques,the IRFPAs usually suffer from bad pixels and stripe noise.The accuracy of the bad pixel detection is always influenced by the stripe noises,which should be optimized for more precise imaging processing.A preliminary"clean"image was accomplished without the influence of stripe noises by reconstructed double density double tree complex wavelet coefficients with different weights.After that,the image preprocessing was utilized to detect the bad pixels with 3滓criterion.Finally,this method was testified by a image processing from short鄄wave IRFPA.The bad pixels detection in the infrared image is much more accurate in spite of the stripe noise.
作者
张瞳
林春
陈洪雷
周松敏
Zhang Tong;Lin Chun;Chen Honglei;Zhou Songmin(Key Laboratory of Infrared Imaging Material and Detectors,Shanghai Institute of Technical Physics of The Chinese Academy of Sciences,Shanghai 200083,China;University of Chinese Academy of Sciences,Beijing 100049,China)
出处
《红外与激光工程》
EI
CSCD
北大核心
2018年第2期69-74,共6页
Infrared and Laser Engineering
关键词
红外焦平面
盲元检测
条纹噪声
双密度双树复数小波
IRFPA
blind pixels detection
stripe noise
double density double tree complex wavelet
