摘要
原子力显微镜(AFM)作为现代微观领域研究的重要工具,在表面分析中具有广泛的应用,它具有非常高的分辨率,是近年来表面成像技术中最重要的进展之一。本文介绍了利用原子力显微镜进行表面分析研究的基本原理以及原子力显微镜的硬件系统组成,重点介绍了利用原子力显微镜在生物、化学、材料等领域进行表面分析的现状。
As an important tool in the research of modern micro field, AFM is widely used in surface analysis, which has a very high resolution, is becoming the most important development surface imaging technology in recent years. The basic principle and hardware of atomic force microscope were reviewed in the paper, the present situation of surface analysis of AFM in biology, chemistry, material and other fields is emphasized.
出处
《邢台职业技术学院学报》
2015年第1期75-78,共4页
Journal of Xingtai Polytechnic College
关键词
原子力显微镜
表面分析
工作原理
atomic force microscopy
surface analysis
working principle
