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“Im-Sn+热处理”涂层工艺研究 被引量:1

Study of "Im-Sn+Heat Treatment" Finish Technology
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摘要 现代电子产品应用和生产中抗恶劣环境的侵蚀能力和贮存过程中可焊性的保持,一直是存在于电子产品应用和生产中的极其重要的问题。寻求一种能较好地同时满足上述要求的表面镀层工艺,国内外均在研究中。介绍了一种经过长时间的全面可靠性和工艺适应性试验后,筛选出来的"Im-Sn+热处理"涂层工艺所表现出的优良的抗环境侵蚀能力和储存中良好的可焊性保持能力。并探讨和分析了形成这种能力的机理。 Anti-erosion ability in electronic product application and harsh production environment and solderability during Storage are important problems in electronic product application and production.A surface finish which can meet all above requirements at the same time has been looked for in the world.An "Im-Sn+ heat treatment" finish Technology is Introduced based on the tests of long time reliability and process adaptability.The finish Technology provides good anti-erosion ability in harsh environment and solderability during Storage.The formation mechanism of the ability and the solderability are discussed.
出处 《电子工艺技术》 2011年第2期76-79,89,共5页 Electronics Process Technology
关键词 涂层 Im-Sn 无铅焊接 虚焊 finish Im-Sn Lead-free soldering Insufficient solder
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  • 1肖代红,陈康华,吴金昌.无铅Sn-Cu电镀层锡须的形成与长大[J].电子工艺技术,2007,28(1):6-9. 被引量:5
  • 2张彬彬,王春青.冷却速率对无铅钎料和焊点质量影响[J].电子工艺技术,2007,28(2):71-73. 被引量:4
  • 3Tomoya KIGA. Mechanism analysis for Tin whisker growth by mechanical stress and mitigation technology [ J ]. Electronic assembly journal, 2008,11 (5) : 356 - 362.
  • 4Asao NISHIMURA. Formation mechanism and mitigation methods of internal stress type whisker[J]. Electronic assembly journal ,2008,11 (5) : 348 - 355.
  • 5Yasuhide OHNO. Growth mechanism of whisker caused by corroded solder[J]. Electronic assembly journal,2008,25 (5) :363 -367.
  • 6Ronald A Bulwith, Michael Trosky, Louis M. Picchione and darlene hug. The black pad failure mechanism - from beginning to end [J]. Global SMT & packaging, 2002(9).
  • 7Torgrim Nordhus Black Pad. Momenter knyttet till en monsterkortfeil [ J ]. EMG - Norautron,2003 (6).
  • 8Walsh Mike. Electroless nickel immersion gold and black pad [ J], CircuiTree ,2001,14( 1 ) : 10 - 16.
  • 9P Snugovsky, P Arrowsmith, M Romanskyl. Electroless Ni/immersion Au interconnects:Investigation of black pad in wire bonds and solder joints [ J ]. Journal of electronic materials,2001,30(9) : 1262.
  • 10许慧,罗道军.元器件纯锡镀层表面晶须风险评估与对策[J].电子工艺技术,2007,28(5):249-252. 被引量:6

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