期刊文献+

High Speed Column-Parallel CDS/ADC Circuit with Nonlinearity Compensation for CMOS Image Sensors

High Speed Column-Parallel CDS/ADC Circuit with Nonlinearity Compensation for CMOS Image Sensors
在线阅读 下载PDF
导出
摘要 A high speed column-parallel CDS/ADC circuit with nonlinearity compensation is proposed in this paper.The correlated double sampling (CDS) and analog-to-digital converter (ADC) functions are integrated in a threephase column-parallel circuit based on two floating gate inverters and switched-capacitor network.The conversion rate of traditional single-slope ADC is speeded up by dividing quantization to coarse step and fine step.A storage capacitor is used to store the result of coarse step and locate the section of ramp signal of fine step,which can reduce the clock step from 2 n to 2 (n/2+1).The floating gate inverters are implemented to reduce the power consumption.Its induced nonlinear offset is cancelled by introducing a compensation module to the input of inverter,which can equalize the coupling path in three phases of the proposed circuit.This circuit is designed and simulated for CMOS image sensor with 640×480 pixel array using Chartered 0.18μm process.Simulation results indicate that the resolution can reach 10-bit and the maximum frame rate can reach 200 frames/s with a main clock of 10MHz.The power consumption of this circuit is less than 36.5μW with a 3.3V power supply.The proposed CDS/ADC circuit is suitable for high resolution and high speed image sensors. A high speed column-parallel CDS/ADC circuit with nonlinearity compensation is proposed in this paper. The correlated double sampling (CDS) and analog-to-digital converter (ADC) functions are integrated in a threephase column-parallel circuit based on two floating gate inverters and switched-capacitor network. The conversion rate of traditional single-slope ADC is speeded up by dividing quantization to coarse step and fine step. A storage capacitor is used to store the result of coarse step and locate the section of ramp signal of fine step, which can reduce the clock step from 2^n to 2^(n/2+1). The floating gate inverters are implemented to reduce the power consumption. Its induced nonlinear offset is cancelled by introducing a compensation module to the input of inverter, which can equalize the coupling path in three phases of the proposed circuit. This circuit is designed and simulated for CMOS image sensor with 640×480 pixel array using Chartered 0.18 μm process. Simulation results indicate that the resolution can reach 10-bit and the maximum frame rate can reach 200 frames/s with a main clock of 10 MHz. The power consumption of this circuit is less than 36.5 μW with a 3.3 V power supply. The proposed CDS/ADC circuit is suitable for high resolution and high speed image sensors.
出处 《Transactions of Tianjin University》 EI CAS 2011年第2期79-84,共6页 天津大学学报(英文版)
基金 Supported by National Natural Science Foundation of China (No.60806010,No.60976030)
关键词 CMOS image sensor two-step single-slope ADC nonlinear offset compensation high speed low power consumption CMOS图像传感器 非线性补偿电路 高速并行 ADC CDS 模拟数字转换器 开关电容网络 并联逆变器
  • 相关文献

参考文献15

  • 1EI Gamal A, Eltoukhy H. CMOS image sensors [J]. IEEE Circuits andDeviees Magazine, 2005, 21 (3) : 6-20.
  • 2Krymski A I, Bock N E, Tu N R et al. A high speed, 240-frames/s, 4.1-Mpixel CMOS sensor [J]. IEEE Transactions on Electron Devices, 2003, 50 (1) : 130-135.
  • 3Yoon Kwangho, Kim Chanki, Lee Bumha et al. Singlechip CMOS image sensor for mobile applications[J]. IEEE Journal of Solid-State Circuits, 2002, 37 (12) : 1839- 1845.
  • 4Snoeij M F, Theuwissen A J P, Makinwa K A Aet al. A CMOS imager with column-level ADC using dynamic column fixed-pattern noise reduction [J]. IEEE Journal of Solid-State Circuits, 2006, 41 (12) : 3007-3015.
  • 5Yang D X D, Fowler B, E1 Gamal A. A nyquist-rate pixellevel ADC for CMOS image sensors [J]. IEEE Journal of Solid-State Circuits, 1999, 34 (3): 348-356.
  • 6Ham S, Jung W, Lee D et al. Ramp slope built-in-selfcalibration scheme for single-slope column analog-to- digital converter complementary metal-oxide-semiconductor image sensor [J]. Japanese Journal of Applied Physics, 2006, 45 (7) : 201-203.
  • 7Sugiki T, Ohsawa S, Miura H et al. A 60 mW 10 b CMOS image sensor with column-to-column FPN reduction [C]. In: Solid-State Circuits Conference, 2000. San Francisco, 2000. 108 -109, 450.
  • 8Mase M, Kawahito S, Sasaki Met al. A wide dynamic range CMOS image sensor with 1multiple exposure-time signal outputs and 12-bit column-parallel cyclic A/D con-verters[J]. IEEE Journal of Solid-State Circuits, 2005, 40(12) : 2787-2795.
  • 9Decker S, McGrath R D, Brehmer K et al. A 256x256 CMOS imaging array with wide dynamic range pixels and column-parallel digital output [J]. IEEE Journal of Solid State Circuits, 1996, 33 (12) : 2081-2091.
  • 10Lim Seunghyun, Lee Jeonghwan, Kim Dongsoo et al. A high-speed CMOS image sensor with column-parallel two- step single-slope ADCs[J]. IEEE Transactions on Electron Devices, 2009, 56 (3) : 393-398.

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部