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高分辨率双侧向测井仪的影响因素分析 被引量:5

Analysis of the Influential Factors on High Resolution Dual Laterolog Tool
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摘要 在组合测井中,影响高分辨率双侧向测井仪的因素较多,使工作状态出现异常现象。根据EIlog高分辨率双侧向测井仪在使用过程中常遇到偶然出现测值混乱、深侧向在高电阻率地层测值偏低或出现负差异、使用地面N电极测井时测值混乱、组合测井中深侧向易受干扰等问题和现象,针对影响因素从测量原理和实验数据等方面分析探讨,并提出实用有效的解决方法,同时着重阐述了正确使用高分辨率双侧向测井仪所不容忽视的各个主要环节。通过实例对比,进一步验证了高分辨率双侧向测井仪具有良好的测井性能和效果。 There are many influential factors on High Resolution Dual Laterolog Tool(HRDL), which may cause abnormal operation status in combination loggings. According to general problems and phenomena which occur in the operation in HRDL of EIlog-05 logging system, such as occasional disordered measurement values of HRDL, lower deep laterolog measurement values or negative differences in high restivity formation, the disordered measurement values of HRDL while using the N electrode on ground and susceptible HRDL's deep laterolog measurement values in combo logging and so on. Based on these influential factors, analyzed are measurement principles and experimental data, proposed are some effective ways to solve the above problems. Emphasized are main steps that can not be ignored in properly running the HRDL. Applications show that HRDL has better measurement capability and effect.
出处 《测井技术》 CAS CSCD 北大核心 2010年第1期98-102,共5页 Well Logging Technology
关键词 高分辨率双侧向测井仪 影响因素 解决方法 分析探讨 HRDL(High Resolution Dual Laterolog Tool), influential factor, solution method, analysis
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