摘要
单片机以其超小型化、高可靠性和高性价比的特点,广泛应用于各个领域。在实验室设计的符合要求的单片机测控系统置于现场后,常常会受到现场各种各样的干扰,所以对单片机测控系统的可靠性提出了更高的要求。在单片机测控系统因干扰复位或掉电后复位均属非正常复位。本文主要分析了单片机系统的非正常复位的类型,针对不同类型的非正常复位分别提出了系统自恢复运行的处理方法,并给出了相应方法的软件处理流程。本文中的方法在实际使用中取得了较好的效果。
Because its miniature, high reliability and high cost performance, the MCU is found wide apply in various field. The MCU measure and control＇s system is often disturbed in various industry field, while the MCU system＇s design is answer for the require in the laboratory. So it is bring forward the more require for the MCU system＇s reliability. The abnormal reset is a sort of reset aroused by the disturbance or the power failure in the MCU system. In the article, we analyze the types of abnormal reset in the MCU system. It brings forward the selfresumption＇s method aim at the different type of the abnormal reset. And it gives the program flow for every types abnormal reset. The measure is better effect in practicality apply.
出处
《电子测试》
2009年第11期85-88,共4页
Electronic Test
关键词
单片机
测控
抗干扰
自复位
SCM
measurement and control
Anti-disturbance
self-resumption
