摘要
研究了研制阶段的成败型产品可靠性的Bayes评估问题。针对当前可靠性评估方法中,经典统计方法无法利用历史信息,而传统Bayes方法又存在对历史信息与现场信息不加区分的缺陷,提出了研制阶段成败型产品可靠性评估模型。模型使用混合验前分布,并用历史样本与现场样本的拟合优度来确定混合分布中的继承因子,这样合理性就很容易得到解释。
This paper investigates Bayes assessment for reliability of success or failure product in the development phases. The classic statistics method can not make use of the history test information and the traditional Bayes method can not differentiate between the history test information and the current information. In order to overcome the limitation of the traditional method, a Bayes assessment model for reliability of success or failure product in the development phases is established. This model uses mixed prior distribution, and determines the inheritance factor by using chi-square goodness of fit. Its rationality is easy to comprehended.
出处
《电子产品可靠性与环境试验》
2006年第5期25-29,共5页
Electronic Product Reliability and Environmental Testing
关键词
可靠性评估
贝叶斯方法
二项分布
混合验前分布
继承因子
reliability assessment
Bayes method
binomial distribution
mixed prior distribution
inheritance factor
