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Gd_2O_3:Eu^(3+)溶胶-凝胶薄膜发光特性研究 被引量:12

Luminescence Properties of Gd_2O_3:Eu^(3+) Sol-Gel Thin Films
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摘要 以无机稀土氧化物为原料制备了Gd2O3:Eu3+溶胶-凝胶薄膜,通过对不同Eu3+离子掺杂浓度、不同烧结温度薄膜发光强度的研究,得出Gd2O3薄膜中Eu3+离子的最佳掺杂浓度为10%、最佳热处理工艺为800℃下烧结2h;由薄膜和粉末激发谱的比较发现:薄膜中存在着比粉末更有效的能量传递,从而更有利于高能射线激发发光;首次观察到薄膜经过1000℃烧结2h后发光消失,并通过SEM和XRD的实验分析对这一现象进行了解释。 In this paper, the sol-gel method with Re2O3 (Re Gd, Eu) as parent compounds was introduced to produce Gd2 O3 :Eu^3+ thin films. From the luminescence intensities of the films doped with different Eu^3+ concentration and annealed at different temperatures, it was found that the optimal dopant concentration and annealing procedure was 10% and 800 ℃ for 2 hours, respectively. By comparing the excitation spectra of the Gd2 O3 : Eu^3 + film and powder, the authors found that the film has higher efficiency for energy transfer from host to dopant, which means that the film would be more suitable than the powder as a radio-luminescence material. In addition, it was first discovered that the luminescence of the film nearly disappeared after 2 hours annealing at 1 000 ℃. The phenomenon was explained with the results of SEM and XRD experiments.
出处 《光谱学与光谱分析》 SCIE EI CAS CSCD 北大核心 2005年第8期1190-1194,共5页 Spectroscopy and Spectral Analysis
基金 "863"高科技项目(2002AA324070) 教育部高等学校优秀青年教师教学科研奖励计划[教人司(2002)123] 高等学校博士点专项科研基金 上海市教育委员会重点学科研究项目 曙光计划(02SG19) 青年教师项目(01QN18)资助
关键词 Gd2O3:Eu^3+薄膜 溶胶-凝胶法 发光特性 X射线成像 溶胶-凝胶薄膜 EU^3+离子 GD2O3 发光强度 特性研究 最佳掺杂浓度 Gd2O3 :Eu^3+ thin films Sol-gel method Luminescence properties X-ray imaging
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  • 1[1]Tarey R D,Raju T A.Thin Solid Films,1985,128:181~189
  • 2[2]Karasawa T,Miyata Y.Thin Solid Films,1993,223:135~139
  • 3[3]Shanthi E,Dutta V,Banerjee A,Chopra K L.J.Appl.Phys.,1980,51(12):6243~6251
  • 4[4]Chatelon J P,Terrier C,Bernstein E,Berjoan R,Roger J A.Thin Solid Films,1994,247:162~168
  • 5[5]Racheva T M.Critchlow G W.Thin Solid Films,1997,292:299~302
  • 6[6]Maddalena A,Maschio R D.Dire S,Raccanelli A.J.Non-Cryst.Solids,1990,121:365~369
  • 7[7]Kim H,Laitinen H A.J.Am.Ceram.Soc.,1975,58(1~2):23~25
  • 8[8]Chopra K L,Major S,Pandya D K.Thin Solid Films,1983,102:1~46
  • 9[9]Belleville P F,Floch H G.Proc.SPIE,1994,2288:25~32
  • 10[10]Cullity B D.2nd ed.California:Addison-Wesley,Publishing Elements of X-ray Diffraction Company,Inc,1978.284

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