Employing the characteristic matrix method, this study investigates transmission properties of onedimensional defective lossy photonic crystals composed of negative and positive refractive index layers with one lossle...Employing the characteristic matrix method, this study investigates transmission properties of onedimensional defective lossy photonic crystals composed of negative and positive refractive index layers with one lossless defect layer at the center of the crystal. The results of the study show that as the refractive index and thickness of the defect layer increase, the frequency of the defect mode decreases. In addition, the study shows that the frequency of the defect mode is sensitive to the incidence angle, polarization, and physical properties of the defect layer, but it is insensitive to the small lattice loss factor. The peak of the defect mode is very sensitive to the loss factor, incidence angle, polarization, refractive index, and thickness of the defect layer. This study also shows that the peak and the width of the defect mode are affected by the numbers of the lattice period and the loss factor. The results can lead to designing new types of narrow filter structures and other optical devices.展开更多
文摘Employing the characteristic matrix method, this study investigates transmission properties of onedimensional defective lossy photonic crystals composed of negative and positive refractive index layers with one lossless defect layer at the center of the crystal. The results of the study show that as the refractive index and thickness of the defect layer increase, the frequency of the defect mode decreases. In addition, the study shows that the frequency of the defect mode is sensitive to the incidence angle, polarization, and physical properties of the defect layer, but it is insensitive to the small lattice loss factor. The peak of the defect mode is very sensitive to the loss factor, incidence angle, polarization, refractive index, and thickness of the defect layer. This study also shows that the peak and the width of the defect mode are affected by the numbers of the lattice period and the loss factor. The results can lead to designing new types of narrow filter structures and other optical devices.
