Test points selection for integer-coded fault wise table is a discrete optimization problem. The global minimum set of test points can only be guaranteed by an exhaustive search which is eompurationally expensive. In ...Test points selection for integer-coded fault wise table is a discrete optimization problem. The global minimum set of test points can only be guaranteed by an exhaustive search which is eompurationally expensive. In this paper, this problem is formulated as a heuristic depth-first graph search problem at first. The graph node expanding method and rules are given. Then, rollout strategies are applied, which can be combined with the heuristic graph search algorithms, in a computationally more efficient manner than the optimal strategies, to obtain solutions superior to those using the greedy heuristic algorithms. The proposed rollout-based test points selection algorithm is illustrated and tested using an analog circuit and a set of simulated integer-coded fault wise tables. Computa- tional results are shown, which suggest that the rollout strategy policies are significantly better than other strategies.展开更多
Test points selection for integer-coded fault wise table is a discrete optimization problem. On one hand, traditional exhaustive search method is computationally expensive. On the other hand, the space complexity of t...Test points selection for integer-coded fault wise table is a discrete optimization problem. On one hand, traditional exhaustive search method is computationally expensive. On the other hand, the space complexity of traditional exhaustive is low. A tradeoff method between the high time complexity and low space complexity is proposed. At first, a new fault-pair table is constructed based on the integer-coded fault wise table. The fault-pair table consists of two columns： one column represents fault pair and the other represents test points set that can distinguish the corresponding faults. Then, the rows are arranged in ascending order according to the cardinality of corresponding test points set. Thirdly, test points in the top rows are selected one by one until all fault pair are isolated. During the test points selection process, the rows that contain selected test points are deleted and then the dimension of fault-pair table decreases gradually. The proposed test points selection algorithm is illustrated and tested using an integercoded fault wise table derived from a real analog circuit. Computational results suggest show policies are better than the exhaustive strategy.展开更多
基金supported by Commission of Science Technology and Industry for National Defence of China under Grant No.A1420061264National Natural Science Foundation of China under Grant No.60934002General Armament Department under Grand No.51317040102)
文摘Test points selection for integer-coded fault wise table is a discrete optimization problem. The global minimum set of test points can only be guaranteed by an exhaustive search which is eompurationally expensive. In this paper, this problem is formulated as a heuristic depth-first graph search problem at first. The graph node expanding method and rules are given. Then, rollout strategies are applied, which can be combined with the heuristic graph search algorithms, in a computationally more efficient manner than the optimal strategies, to obtain solutions superior to those using the greedy heuristic algorithms. The proposed rollout-based test points selection algorithm is illustrated and tested using an analog circuit and a set of simulated integer-coded fault wise tables. Computa- tional results are shown, which suggest that the rollout strategy policies are significantly better than other strategies.
基金supported by National Natural Science Foundation of China under Grant No.60934002General Armament Department under Grant No.51317040102
文摘Test points selection for integer-coded fault wise table is a discrete optimization problem. On one hand, traditional exhaustive search method is computationally expensive. On the other hand, the space complexity of traditional exhaustive is low. A tradeoff method between the high time complexity and low space complexity is proposed. At first, a new fault-pair table is constructed based on the integer-coded fault wise table. The fault-pair table consists of two columns： one column represents fault pair and the other represents test points set that can distinguish the corresponding faults. Then, the rows are arranged in ascending order according to the cardinality of corresponding test points set. Thirdly, test points in the top rows are selected one by one until all fault pair are isolated. During the test points selection process, the rows that contain selected test points are deleted and then the dimension of fault-pair table decreases gradually. The proposed test points selection algorithm is illustrated and tested using an integercoded fault wise table derived from a real analog circuit. Computational results suggest show policies are better than the exhaustive strategy.
