In this paper, we focus on practical issues in implementing a calibration technique for medium-resolution, highspeed flash analogtodigital converters （ADCs）. In [1], we theoretically describ the calibration techniqu...In this paper, we focus on practical issues in implementing a calibration technique for medium-resolution, highspeed flash analogtodigital converters （ADCs）. In [1], we theoretically describ the calibration technique and perform a behaviorallevel simulation to test its functionality [1]. In this work, we discuss some issues in transistorlevel implementation. The predominant factors that contribute to static errors such as reference generator mismatch and trackandhold （T/H） gain error can be treated as inputreferred offsets of each comparator. Using the proposed calibration technique, these errors can be calibrated with minimal detriment to the dynamic performance of the converter. We simulate a transistorlevel implementation of a 5-bit, 1 GHz ADC in a 1.2 V, 65 nm CMOS process. The results show that DNL can be improved from 2.5 LSB to below 0.7 LSB after calibration, and INL can be improved from 1.6 LSB to below 0.6 LSB after calibration.展开更多
A high performance sample-and-hold （S/H） circuit used in a pipelined analog-to-digital converter （ADC） is presented. Capacitor flip-around architecture is used in this S/H circuit with a novel gain-boosted differe...A high performance sample-and-hold （S/H） circuit used in a pipelined analog-to-digital converter （ADC） is presented. Capacitor flip-around architecture is used in this S/H circuit with a novel gain-boosted differential folded cascode operational transconductance amplifier. A double-bootstrapped switch is designed to improve the performance of the circuit. The circuit is implemented using a 0.18 μm 1P6M CMOS process. Measurement results show that the effective number of bits is 14.03 bits, the spurious free dynamic range is 94.62 dB, the signal to noise and distortion ratio is 86.28 dB, and the total harmonic distortion is -91.84 dB for a 5 MHz input signal with 50 MS/s sampling rate. A pipeline ADC with the designed S/H circuit has been implemented.展开更多
文摘In this paper, we focus on practical issues in implementing a calibration technique for medium-resolution, highspeed flash analogtodigital converters （ADCs）. In [1], we theoretically describ the calibration technique and perform a behaviorallevel simulation to test its functionality [1]. In this work, we discuss some issues in transistorlevel implementation. The predominant factors that contribute to static errors such as reference generator mismatch and trackandhold （T/H） gain error can be treated as inputreferred offsets of each comparator. Using the proposed calibration technique, these errors can be calibrated with minimal detriment to the dynamic performance of the converter. We simulate a transistorlevel implementation of a 5-bit, 1 GHz ADC in a 1.2 V, 65 nm CMOS process. The results show that DNL can be improved from 2.5 LSB to below 0.7 LSB after calibration, and INL can be improved from 1.6 LSB to below 0.6 LSB after calibration.
基金supported by the National Science and Technology Major Project of China(No.2012ZX03004008)
文摘A high performance sample-and-hold （S/H） circuit used in a pipelined analog-to-digital converter （ADC） is presented. Capacitor flip-around architecture is used in this S/H circuit with a novel gain-boosted differential folded cascode operational transconductance amplifier. A double-bootstrapped switch is designed to improve the performance of the circuit. The circuit is implemented using a 0.18 μm 1P6M CMOS process. Measurement results show that the effective number of bits is 14.03 bits, the spurious free dynamic range is 94.62 dB, the signal to noise and distortion ratio is 86.28 dB, and the total harmonic distortion is -91.84 dB for a 5 MHz input signal with 50 MS/s sampling rate. A pipeline ADC with the designed S/H circuit has been implemented.
