期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
Low specific contact resistivity to graphene achieved by AuGe/Ni/Au and annealing process
1
作者 于淑珍 宋焱 +3 位作者 董建荣 孙玉润 赵勇明 何洋 《Chinese Physics B》 SCIE EI CAS CSCD 2016年第11期571-575,共5页
Low metal-graphene contact resistance is important in making high-performance graphene devices.In this work,we demonstrate a lower specific contact resistivity of Au0.88Ge0.12/Ni/Au-graphene contact compared with Ti/A... Low metal-graphene contact resistance is important in making high-performance graphene devices.In this work,we demonstrate a lower specific contact resistivity of Au0.88Ge0.12/Ni/Au-graphene contact compared with Ti/Au and Ti/Pt/Au contacts.The rapid thermal annealing process was optimized to improve AuGe/Ni/Au contact resistance.Results reveal that both pre- and post-annealing processes are effective for reducing the contact resistance.The specific contact resistivity decreases from 2.5 × 10^-4 to 7.8 × 10^-5 Ω·cm^2 by pre-annealing at 300 ℃ for one hour,and continues to decrease to 9.5 × 10^-7 H·cm2 after post-annealing at 490 ℃ for 60 seconds.These approaches provide reliable means of lowering contact resistance. 展开更多
关键词 annealing resistivity annealed lithography contacts doping alloyed lowering align methacrylate
在线阅读 下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部