Zinc Oxide （ZnO） nanostructure were synthesized by precipitating Zinc Chloride and analyzed structurally and optically. Samples were prepared at different thickness （62, 66, 74, 86, 92, and 110 nm）, and substrate ...Zinc Oxide （ZnO） nanostructure were synthesized by precipitating Zinc Chloride and analyzed structurally and optically. Samples were prepared at different thickness （62, 66, 74, 86, 92, and 110 nm）, and substrate temperature kept at 400 ℃ in all cases. Compressed Nitrogen was used as a cartier gas. The samples of the ZnO films were characterized by X-ray diffraction （XRD）, and atomic force microscopy （AFM）. The XRD results indicated that the synthesized ZnO thin films have a pure wurtzite （hexagonal phase） structure. It can be seen that the highest texture coefficient was in （002） plan for nanostructure films. AFM measurement showed the grain size ranging from 62-86 nm. The optical band gap energy （Ee,） of ZnO nanostructure have two values for the same sample and the Eg decrease with increasing thickness utilizing the optical data using UV-Vis spectrophotometer.展开更多
文摘Zinc Oxide （ZnO） nanostructure were synthesized by precipitating Zinc Chloride and analyzed structurally and optically. Samples were prepared at different thickness （62, 66, 74, 86, 92, and 110 nm）, and substrate temperature kept at 400 ℃ in all cases. Compressed Nitrogen was used as a cartier gas. The samples of the ZnO films were characterized by X-ray diffraction （XRD）, and atomic force microscopy （AFM）. The XRD results indicated that the synthesized ZnO thin films have a pure wurtzite （hexagonal phase） structure. It can be seen that the highest texture coefficient was in （002） plan for nanostructure films. AFM measurement showed the grain size ranging from 62-86 nm. The optical band gap energy （Ee,） of ZnO nanostructure have two values for the same sample and the Eg decrease with increasing thickness utilizing the optical data using UV-Vis spectrophotometer.
