A novel technique to fabricate ultra deep high aspect ratio electrical isolation trenches with DRIE and dielectric refill is presented.The relationship between trench profile and DRIE parameters is discussed.By optimi...A novel technique to fabricate ultra deep high aspect ratio electrical isolation trenches with DRIE and dielectric refill is presented.The relationship between trench profile and DRIE parameters is discussed.By optimizing DRIE parameters and RIE etching the trenches’ opening,the ideal trench profile is obtained to ensure that the trenches are fully refilled without voids.The electrical isolation trenches are 5μm wide and 92μm deep with 0.5μm thick oxide layers on the sidewall as isolation material.The measured I-V result shows that the trench structure has good electrical isolation performance:the average resistance in the range of 0～100V is more than 10 11Ω and no breakdown appears under 100V.This isolation trench structure has been used in fabrication of the bulk integrated micromachined gyroscope,which shows high performance.展开更多
This paper experimentally studies the effects of the conductivity of a silicon wafer and the gap height between silicon structures and glass substrate on the footing effect for silicon on glass （SOG） structures in t...This paper experimentally studies the effects of the conductivity of a silicon wafer and the gap height between silicon structures and glass substrate on the footing effect for silicon on glass （SOG） structures in the deep reactive ion etching （DRIE） process. Experiments with gap heights of 5,20, and 50μm were carried out for performance comparison of the footing effect. Also,two kinds of silicon wafers with resistivity of 2-4 and 0.01-0. 0312Ω· cm were used for the exploration. The results show that structures with resistivity of 0.01 - 0. 0312Ω· cm have better topography than those with resistivity of 2-4Ω· cm; and structures with 50μm-high gaps between silicon structures and glass substrate suffer some- what less of a footing effect than those with 20μm-high gaps,and much less than those with Stem-high gaps. Our theoretical analysis indicates that either the higher conductivity of the silicon wafer or a larger gap height between silicon structures and glass substrate can suppress footing effects. The results can contribute to the choice of silicon type and optimum design for many microsensors.展开更多
文摘A novel technique to fabricate ultra deep high aspect ratio electrical isolation trenches with DRIE and dielectric refill is presented.The relationship between trench profile and DRIE parameters is discussed.By optimizing DRIE parameters and RIE etching the trenches’ opening,the ideal trench profile is obtained to ensure that the trenches are fully refilled without voids.The electrical isolation trenches are 5μm wide and 92μm deep with 0.5μm thick oxide layers on the sidewall as isolation material.The measured I-V result shows that the trench structure has good electrical isolation performance:the average resistance in the range of 0～100V is more than 10 11Ω and no breakdown appears under 100V.This isolation trench structure has been used in fabrication of the bulk integrated micromachined gyroscope,which shows high performance.
文摘This paper experimentally studies the effects of the conductivity of a silicon wafer and the gap height between silicon structures and glass substrate on the footing effect for silicon on glass （SOG） structures in the deep reactive ion etching （DRIE） process. Experiments with gap heights of 5,20, and 50μm were carried out for performance comparison of the footing effect. Also,two kinds of silicon wafers with resistivity of 2-4 and 0.01-0. 0312Ω· cm were used for the exploration. The results show that structures with resistivity of 0.01 - 0. 0312Ω· cm have better topography than those with resistivity of 2-4Ω· cm; and structures with 50μm-high gaps between silicon structures and glass substrate suffer some- what less of a footing effect than those with 20μm-high gaps,and much less than those with Stem-high gaps. Our theoretical analysis indicates that either the higher conductivity of the silicon wafer or a larger gap height between silicon structures and glass substrate can suppress footing effects. The results can contribute to the choice of silicon type and optimum design for many microsensors.
