摘要
采用能谱仪(EDS)、光学显微镜(OM)、扫描电镜(SEM)、原子力显微镜(AFM)、表面三维轮廓仪及超声波仪,对Cu-Ni-Si合金带材表面白线缺陷及对应的铸态样品的化学成分和微观形貌进行观察和分析,探讨了白线缺陷的产生原因。结果表明:白线区域宏观上为基体大晶粒,表面覆盖一层不均匀的1~2μm的小颗粒,微观上存在白色孔洞区域、黑色孔洞区域以及孔洞周边颗粒区3种典型形貌,其中孔洞尺寸大小为2~5μm,孔洞深度约为200 nm。经过EDS测试,这3种形貌周围组织中O, Mg, Si元素含量较基体正常部分偏高;白线缺陷对应铸态样品经超声波检测后有缺陷回波,内部存在疏松缺陷,铸态缺陷处形貌与带材白线缺陷处形貌类似,且铸态缺陷处成分同样富含O, Mg,Si元素。因此,带材白线缺陷的产生原因可归结为铸锭内的疏松缺陷经后续加工形成。
The chemical composition and microstructuremorphology of the white line defects on the surface of Cu-Ni-Si alloy strip and the corresponding ingot samples were observed and analyzed by Energy Disperse Spectroscopy(EDS),optical microscope(OM),scanning electron microscope(SEM),atomic force microscope(AFM),surface 3D profilometerand ultrasonic wave.The causes of the white line defects were discussed.The results show that the white line area is macroscopically covered with an uneven layer of 1~2μm small particles on the surface of the large grain matrix.On the microscopically,there are three typical morphologies:the white cavity area,the black cavity area and the surrounding particle area.The pore size is 2~5μm and the pore depth is about 200 nm.EDS test showed that the content of O,Mg and Si elements in the tissues around the three morphologies were higher than those in the normal part of the matrix.The white line defect corresponds to the defect echo of the ingot sample after ultrasonic detection.There are loose defects inside,and the appearance of the defect is similar to that of the strip white line.In addition,the components in the cast defect are also rich in O,Mg and Si elements.Therefore,the cause of the strip white line defect can be attributed to the loose defect in the ingot formed by subsequent processing.
作者
张英
孟凡俭
方晓阳
刘爱奎
ZHANG Ying;MENG Fanjian;FANG Xiaoyang;LIU Aikui(KMD Precise Copper Strip(Henan)Co.,Ltd.,Xinxiang 453000,China;Center for X-Mechanics,Zhejiang University,Hangzhou 310027,China)
出处
《铜业工程》
CAS
2023年第2期92-100,共9页
Copper Engineering
基金
2022年度河南省重大科技专项(221100210300)资助。
